3.3.1.61. NXxas_mode¶
Status:
base class, extends NXobject
Description:
XAS measurement mode
Symbols:
No symbol table
- Groups cited:
Structure:
name: (optional) NX_CHAR
X-ray absorption spectroscopy (XAS) is a technique that measures the absorptio ...
X-ray absorption spectroscopy (XAS) is a technique that measures the absorption coefficient \(\mu(E)\) of a material as a function of energy.
The name of the XAS mode indicates the type of process being monitored to obtain the spectrum. Below is a description of the available modes, with emphasis on the expected values for the intensity and monitor fields.
Transmission
The absorption coefficient is obtained by measuring the intensity of the incident \(I_0\) and transmitted beam \(I\).
\[\mu(E) = -\ln(I/I_0)\]
Total fluorescence yield (TFY)
The absorption coefficient is obtained by measuring the intensity of the emitted fluorescence \(I_f\) and the incident beam \(I_0\).
\[\mu(E) \propto I_f/I_0\]
Partial fluorescence yield (PFY)
Inverse partial fluorescence yield (IPFY)
High-energy resolution fluorescence detection (HERFD)
Total electron yield (TEY)
Partial electron yield (PEY)
Electron energy loss (EELS)
X-ray Raman Scattering (XRS)
Diffraction Anomalous Fine Structure (DAFS)
X-ray Excited Optical Luminescence (XEOL)
Grazing Angle Reflection Extended X-ray Absorption Fine Structure (ReflEXAFS)
Other
Any of these values:
transmission: Transmission
tfy: Total Fluorescence Yield
pfy: Partial Fluorescence Yield
ipfy: Inverse Partial Fluorescence Yield
herfd: High Energy Resolution Fluorescence Detected
tey: Total Electron Yield
pey: Partial Electron Yield
eels: Electron Energy Loss
raman: X-ray Raman Scattering
dafs: Diffraction Anomalous Fine Structure
xeol: X-ray Excited Optical Luminescence
reflexafs: Grazing Angle Reflection Extended X-ray Absorption Fine Structure
other: Otheremission_lines: (optional) NXemission_lines
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.